X-ray diffraction

S. Arrii-Clacens (

– Bruker diffractometer “D5005” with a semiconductor detector energy dispersive X-SOL.
Photo S. Arrii-Clacens IC2MP Poitiers

– Diffractometer Bruker “D8 Advance” equipped with a linear detector and a VANTEC rapid heating chamber Anton Paar (htk16).
D8 Advance
Photo S. Arrii-Clacens IC2MP Poitiers

– PANalytical diffractometer “Empyrean” with a fast detector Xcelerator and a sample changer 45 positions.

Photo S. Arrii-Clacens IC2MP Poitiers

Devices and D5005 Empyrean syntheses allow verification, the identification phase, the determination of the size of the crystallites and the Rietveld refinement. As for the device with a room temperature, it allows characterizations temperature: up to 1100 ° C-1200 ° C using a blade Kanthal (FeCrAl alloy) as support, and controlled atmosphere: inert gas , oxidizing, reducing agents.



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